X-ray Fluorescence 

The Micro XRF device (Unisantis XMF104 model) is designed for quantitative and qualitative analysis of elements ranging from silicon to uranium (atomic numbers 14 to 92). Here are the key features:

     - Performs fast and accurate non-destructive measurements using EDXRF analysis.

     - Has the ability to analyze materials in minute quantities, even up to a few hundred microns, in both bulk and powder forms.

     - Utilizes external software to analyze results, supporting up to 20 elements.

X-ray Diffraction

The XRD machine (Unisantis XMD300 model) offers advanced capabilities for material analysis, including:

     - The flexibility to analyze bulk (non-powder) and powder samples

     - Qualitative and quantitative phase measurements using external software

     - A 2θ angle range from 5 to 120 degrees

     - The feature to rotate the sample during analysis

     - Rapid measurement